AwardedGermanyGoods
Wafer inspection system (WIS) - PR1006153-2350 -W
- Published
- Published 12 December 2025
Overview
PR1006153-2350 -W Automatisiertes Waferinspektiosnsystem /Wafer inspection system (WIS) with automated handling and sorting station for the characterization and classification of crystalline silicon wafers for solar cell production
Key details
- Country
- Germany
- Status
- Awarded
- Category
- Goods
- Procedure
- Direct
- Published
- 12 December 2025
Miscellaneous special-purpose machinery
Award outcome
- Awarded value
- -€1
- Award date
- 10 December 2025
- Contract period
- 3 August 2026 → 7 August 2026
- FORTIX
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Notice history
Every published notice in this contracting process, newest first.
Contract Award Notice
12 December 2025
Contracting authority
Fraunhofer-Gesellschaft, Einkauf B12
Procuring entityMünchen, Germany
Authority website ↗
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