AwardedBelgiumGoods
Automatic Wafer Probers
- Published
- Published 10 February 2025
Overview
In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for testing micrometer-thin (a few hundred) to millimetre-thick samples or wafers of 200 mm and 300 mm diameter and for probing dies on wafer frames (for 300 mm wafers on dicing frames).
Key details
- Country
- Belgium
- Status
- Awarded
- Category
- Goods
- Procedure
- Limited
- Published
- 10 February 2025
Laboratory, optical and precision equipments (excl. glasses)
Award outcome
- Awarded value
- €0
- Award date
- 20 October 2025
- Contract period
- 1 July 2025 → 30 June 2029
- Accretech
- Tokyo Electron Ltd
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Notice history
Every published notice in this contracting process, newest first.
Contract Award Notice
28 October 2025
Contract Notice
4 March 2025
Contract Notice
10 February 2025
Contracting authority
Imec EU Pilot line NV
Procuring entityHeverlee, Belgium
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