AwardedNetherlandsGoods€610,000
Focused Ion Beam Scanning Electron Microscope
- Published
- Published 11 March 2026
Overview
Voor deze onderzoeksdoelen is gedetailleerde analyse van microstructuren en interfaces essentieel. Een FIB-SEM (Focused Ion Beam Scanning Electron Microscope) is noodzakelijk om:
• 3D-reconstructies van elektrodematerialen te maken en porositeit en degradatiemechanismen te analyseren.
• Lokale karakterisering van interfaces, zoals de Solid Electrolyte Interphase, uit te voeren, wat cruciaal is voor levensduur en veiligheid.
• Structurele veranderingen tijdens batterijcycli te onderzoeken, ter ondersteuning van de ontwikkeling van nieuwe batterijchemieën.
• Monsters met hoge precisie voor te bereiden voor Transmission Electron Microscopy (TEM) en operando studies. 1
Key details
- Country
- Netherlands
- Status
- Awarded
- Category
- Goods
- Estimated value
- €610,000
- Procedure
- Direct
- Published
- 11 March 2026
Electron microscopes
Award outcome
- Awarded value
- €610,000
- Award date
- 10 March 2026
- Contract period
- — → 12 March 2026
- Carl Zeiss B.V.
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Notice history
Every published notice in this contracting process, newest first.
Contract Award Notice
29 May 2026
Contract Notice
11 March 2026
Contracting authority
Technische Universiteit Delft
Procuring entityDelft, Netherlands
Authority website ↗
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